Using External High-Resolution Log Scanning to Determine Internal Defect Characteristics

TitleUsing External High-Resolution Log Scanning to Determine Internal Defect Characteristics
Publication TypeConference Paper
Year of Publication2006
AuthorsThomas, E., L. Thomas, C. A. Shaffer, and L. Mili
Conference NameProceedings of the 15th Central Hardwood Forestry Conference
Date PublishedFebruary